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Semiconductor and Material Spectroscopy Laboratory
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Enhanced Photoresponse of WS2 Photodetectors through Interfacial Defect Engineering Using a TiO2 Interlayer

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Enhanced Photoresponse of WS2 Photodetectors through Interfacial Defect Engineering Using a TiO2 Interlayer

by Yusin Pak, Woojin Park, Naresh Alaal, Yogeenth Kumaresan, S Assa Aravindh, Somak Mitra, Bin Xin, Jung-Wook Min, Hyeonghun Kim, Namsoo Lim, Byungjin Cho, Gun-Young Jung, Muhammad M Hussain, Iman S Roqan
Year: 2020 DOI: https://doi.org/10.1021/acsaelm.0c00011

Abstract

To develop a stable and reliable two-dimensional (2D) tungsten disulfide (WS2)-based photodetector (PD), it is essential to address the issue of interfacial defects that are unavoidably formed at the interface between WS2 and metal contact as such defects can markedly deteriorate photoresponse characteristics. In this work, this drawback is mitigated by adopting a facile technique for passivating a WS2 surface with an ultrathin TiO2 film. The TiO2 interlayer is deposited on the 2D WS2 surface via 20 cycles of atomic layer deposition prior to proceeding with photolithography and contact metal deposition. Advanced characterizations reveal that TiO2/WS2 PDs exhibit enhanced photoresponse compared to bare WS2. Much higher photoresponsivity (∼10 times higher at 1 mW/cm2) and faster recovery (∼124 times faster at 0.1 V) are obtained from TiO2/WS2 PDs relative to bare WS2 PDs. The mechanism underlying …

Keywords

Enhanced Photoresponse of WS2 Photodetectors through Interfacial Defect Engineering Using a TiO2 Interlayer
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