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Semiconductor and Material Spectroscopy Laboratory
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Lattice site location of optical centers in GaN:Eu light emitting diode material grown by organometallic vapor phase epitaxy

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Lattice site location of optical centers in GaN:Eu light emitting diode material grown by organometallic vapor phase epitaxy

by K. Lorenz, E. Alves, Iman Salem Roqan, K.P. O’Donnell, A. Nishikawa, Y. Fujiwara, M. Bockowski
Year: 2010

Bibliography

K. Lorenz, E. Alves, I. S. Roqan, K. P. O’Donnell, A. Nishikawa, Y. Fujiwara, and M. Boćkowski, Lattice site location of optical centers in GaN:Eu light emitting diode material grown by organometallic vapor phase epitaxy, Appl. Phys. Lett. 97, 1119112010.

Abstract

Eu-doped GaN was grown by organometallic vapor phase epitaxy at temperatures from 900 to 1100 °C . Eu incorporation is influenced by temperature with the highest concentration found for growth at 1000 °C . In all samples, Eu is incorporated entirely on substitutional Ga sites with a slight displacement which is highest (∼0.2 Å) in the sample grown at 900 °C and mainly directed along the c-axis. The major optical Eu 3+ centers are identical for in situdoped and ion-implanted samples after high temperature and pressure annealing. The dominant Eu 3+ luminescence lines are attributed to isolated, substitutional Eu.

Keywords

Photoluminescence Doping Light emitting diodes III-V semiconductors
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